Equipement Company(Model) Experiment Remark
Monochromater 0.3 m Triple grating
(UV-Visible-IR range)
ARC(300i) PL, PLE, TRPL NCL controller
0.15 m Triple grating
(Visible-IR range)
ARC(150i) PLE, PR NCL controller
0.3 m Triple grating
(Visible-UV range)
ARC(300i) PL, PLE, EL NCL, USB
0.15 m Triple grating
(Visible-UV range)
ARC(150i) PLE, PR NCL controller
0.3 m Triple grating
(Visible range)
ARC(300i) PL, SE -
0.85 m Double Spectrometer
(Visible range)
SPEX(1403) Raman, PL -
ViS/NIR CCD Spectrometer Oceanoptics SE, EL -
0.3 m CVI grating
(Visible-IR range)
CVI NSOM -
Source(Laser) DPSS Laser
(5W)
Verdi TRPL -
Ti-Sapphire Laser
(700-1000 nm)
Mira 900 TRPL -
He-Cd Laser
(325, 442 nm)
KIMMON PL, PR -
He-Ne Laser
(632.8 nm)
Coherent PL, SPR 3 ea
Nd:YAG Laser
(266 nm)
JDS PL -
Nd:YAG Laser
(266, 355, 532,1064 nm)
SpecraPhysics PL, SE -
Laser Diode
(405 nm)
SAIT(proto) PL -
DPSS Laser
(532 nm)
JS Laser PL -
Source(Lamp) Xenon Lamp
(300 W)
Oriel (#6258) PLE,Transmission -
Halogen Lamp
(250 W)
Oriel (#6334) PLE,Transmission -
Source(Electric) DC Power Supply
(3 A, 36 V)
Array Electronic (3645A) EL -
Current Source EG & K Hall measurement Low.-Tem.
Detector PDA ARC IR range -
InGaAs PD ARC IR range -
Ext. InGaAs PD Hamamatsu IR range (Ext.) -
PMT ARC Vis.-UV range -
MCP-PMT Hamamatsu Vis.-UV-IR TCSPC
EasyPLL Nanosurf NSOM -
IPDA IRY-700/L Visible range -
EMP-2000A Molectron Power meter J, W
FLUKE OPHIR(#55-642) Power meter -
Cryostat Open system (Schroud) Janis Anti-vibration -
Closed cycle system Janis (#22) Recycle system -
Closed cycle system Air product Recycle system -
Closed cycle system Janis Hall measuremnt -
Optical Microsope Standard Microscope Olympus (BX-51) Micro-Raman, Micro-PL, Optical Tweezing -
Inverted Microscope Olympus In vivo/vitro Fluoscence lifetime of Bio, Semiconductor Low.-Tem.
Growth & Process MOCVD Tomas Swan(CS13509) Growth -
ICP-RIE Oxford(814652) Etching -
Wet Station MIDAS Etching -
Spin Coater MIDAS (1200D) Coating -